ITS provides full service custom TPS development
for all types of digital modules, and specializes
in advanced architectures. Our services include netlist
creation, custom device modeling, Interface Test Adapter
design and development, simulation, Automated and
fault Probe Isolation, fault grading and tester integration.
ITS test programs have full diagnostic capabilities,
both trace and fault dictionary diagnostics. JTAG
Boundary Scan and Cluster test approaches.
ITS has extensive experience in VXI Based,
L2XX, L3XX, HP3070, IFTE and Consolidated Automated
Support Systems (CASS) integration for all types of
modules, including ceramic (S.E.M.), dual sided, dip
and surface mount on mechanical and vacuum fixtures.
Our TPS services are tailored to the development
of advanced functional tests for the most complicated
module architectures. Microprocessor based, multi-peripheral,
multi-ASIC, and multi-protocol designs are our specialty.
ITS's proficiency in the area or modeling and simulation
development allow us to handle the most complicated
modules from a system level. |
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